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Mostrati risultati da 21 a 40 di 136
Titolo Data di pubblicazione Autore(i) File
Noise, Biased Percolation and Abrupt Failure of Electronic Devices 1-gen-1997 Pennetta, Cecilia; Z., Gingl; L. B., Kiss; Reggiani, Lino
Mechanisms of Breakdown in Semi-Insulating GaAs Detectors Under High Reverse Bias Conditions Studied by EBIC and OBIC 1-gen-1997 Mazzer, M.; Cola, A.; Vasanelli, Lorenzo; DE VITTORIO, M.; Pennetta, Cecilia; Reggiani, Lino
Mechanisms of breakdown in semi-insulating GaAs detectors under high reverse bias conditions studied by EBIC and OBIC 1-gen-1997 M., Mazzer; A., Cola; Vasanelli, Lorenzo; DE VITTORIO, Massimo; Pennetta, Cecilia; L., Reggiani
A Biased Percolation Model for the Analysis of Electronic Device Degradation 1-gen-1998 Z., Gingl; Pennetta, Cecilia; L. B., Kiss; L., Reggiani
A Percolative Simulation of Dielectric-Like Breakdown 1-gen-1998 Pennetta, Cecilia; Gingl, Z.; Kiss, L. B.; Reggiani, L.; DE VITTORIO, M.; Cola, A.; Mazzer, M.
A percolative simulation of dielectric-like breakdown 1-gen-1998 Pennetta, Cecilia; Z., Gingl; L. B., Kiss; L., Reggiani; A., Cola; DE VITTORIO, Massimo; M., Mazzer
A Percolative Study of Electrical Breakdown 1-gen-1998 Pennetta, Cecilia; Reggiani, Lino; Z., Gingl; L. B., Kiss
Excess Thermal-Noise in the Electrical Breakdown of Random Resistor Networks 1-gen-1999 Pennetta, Cecilia; L. B., Kiss; Z., Gingl; L., Reggiani
Thermal Effects on the Electrical Degradation of Thin Film Resistors 1-gen-1999 Pennetta, Cecilia; L., Reggiani; L. B., Kiss
A Stochastic Approach to Failure Analysis in Electromigration Phenomena 1-gen-1999 Pennetta, Cecilia; L., Reggiani; G., Trefan; F., Fantini; I., Demunari; A., Scorzoni
A Percolative Approach to Reliability of Thin Films 1-gen-2000 Pennetta, Cecilia; L., Reggiani; G., Trefan
Scaling Law of Resistance Fluctuations in Stationary Random Resistor Networks 1-gen-2000 Pennetta, Cecilia; L., Reggiani; G., Trefan
Scaling and Universality in Electrical Failure of Thin Films 1-gen-2000 Pennetta, Cecilia; L., Reggiani; G., Trefan
A Noise Temperature Analysis of the Electrical Degradation of Thin Nanostructured Films 1-gen-2000 Pennetta, Cecilia; L. B., Kiss; Z., Gingl; Reggiani, Lino
A Percolative Approach to Resistance Fluctuations 1-gen-2000 Pennetta, Cecilia; G., Trefan; Reggiani, Lino
Frontiers in Electronic Noise: from Submicron to Nano Structures 1-gen-2000 Reggiani, Lino; Pennetta, Cecilia; G., Trefan; J. C., Vaissiere; L., Varani; V., Gruzinskis; A., Reklaitis; P., Shiktorov; E., Starikov; T., Gonzalez; J., Mateos; D., Pardo; O. M., Bulashenko
, A percolative approach to reliability of thin film interconnects and ultra-thin dielectrics 1-gen-2000 Pennetta, Cecilia; L., Reggiani; Gy, Trefn; Cataldo, Rosella; DE NUNZIO, Giorgio
A percolative approach to reliability of thin film interconnects and ultra thin dielectrics 1-gen-2000 Pennetta, Cecilia; L., Reggiani; Gy, Trefan; Cataldo, Rosella; DE NUNZIO, Giorgio
A Percolative Approach to Reliability of thin Film Interconnects and Ultra-Thin Dielectrics 1-gen-2001 Pennetta, Cecilia; Reggiani, Lino; G., Trefan; Cataldo, Rosella; DE NUNZIO, Giorgio
Investigation of the Role of Compositional Effects on Electromigration Damage of Metallic Interconnects 1-gen-2001 Pennetta, Cecilia; Reggiani, Lino; G., Trefan; F., Fantini; A., Scorzoni; I., DE MUNARI
Mostrati risultati da 21 a 40 di 136
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