This paper presents a performance analysis of a system for electrochemical impedance spectroscopy (EIS). The system, composed by an analog front-end (AFE) and a custom microcontroller (MCU) board, performs the impulse response (IR) measurement of linear and time-invariant (LTI) systems with pseudo-random excitation signals. As a novelty, a specific AFE for the interfacing of two-terminal resistive and capacitive sensors is covered in detail. The paper proposes, for the first time, a mathematical model to predict the impact of the main noise sources in the measured IR. Thanks to the proposed approach, the AFE and the system’s parameters can be properly designed in order to reduce the error, thus, minimizing the energy-per-error figure of merit (FOM) as well. The AFE is realized as discrete-components circuit and it has been included in a custom MCU-based measurement system as an expansion module. The predicted results from the mathematical model, in terms of noise power, SNR, and measurement error are validated through system-level simulation and experimental measurements. The system performs the IR measurement with 1023 points, showing root-mean-square (RMS) measurement errors of 1% and 1.4% for the tested ADC sampling frequencies of 62.5 kHz and 125 kHz, respectively. These lead to excellent FOM values of 128.9 mJ · % 2 and 252.6 mJ · % 2 that outstand the state of the art.

Performance Analysis of an MLS-Based Interface for Impulse Response Estimation of Resistive and Capacitive Sensors

Simonetta Capone;Stefano D'Amico
Ultimo
2022

Abstract

This paper presents a performance analysis of a system for electrochemical impedance spectroscopy (EIS). The system, composed by an analog front-end (AFE) and a custom microcontroller (MCU) board, performs the impulse response (IR) measurement of linear and time-invariant (LTI) systems with pseudo-random excitation signals. As a novelty, a specific AFE for the interfacing of two-terminal resistive and capacitive sensors is covered in detail. The paper proposes, for the first time, a mathematical model to predict the impact of the main noise sources in the measured IR. Thanks to the proposed approach, the AFE and the system’s parameters can be properly designed in order to reduce the error, thus, minimizing the energy-per-error figure of merit (FOM) as well. The AFE is realized as discrete-components circuit and it has been included in a custom MCU-based measurement system as an expansion module. The predicted results from the mathematical model, in terms of noise power, SNR, and measurement error are validated through system-level simulation and experimental measurements. The system performs the IR measurement with 1023 points, showing root-mean-square (RMS) measurement errors of 1% and 1.4% for the tested ADC sampling frequencies of 62.5 kHz and 125 kHz, respectively. These lead to excellent FOM values of 128.9 mJ · % 2 and 252.6 mJ · % 2 that outstand the state of the art.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11587/471730
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