XPS and Brewster Angle Microscopy/Reflection Spectroscopy were applied to characterization of Langmuir Blodgett films of macrocycles deposited on quartz crystal microbalance as recognition elements of phenol sensors. Interpretation of diffusion-controlled sensor response and reduced interference by fulvic/humic acids were supported by spectroscopic and microscopic findings.
Characterisation of Langmuir-Blodgett films of phthalocyanines employed as recognition layers in phenol QCM sensors
MALITESTA, Cosimino;VALLI, Ludovico;
2003-01-01
Abstract
XPS and Brewster Angle Microscopy/Reflection Spectroscopy were applied to characterization of Langmuir Blodgett films of macrocycles deposited on quartz crystal microbalance as recognition elements of phenol sensors. Interpretation of diffusion-controlled sensor response and reduced interference by fulvic/humic acids were supported by spectroscopic and microscopic findings.File in questo prodotto:
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