Emission of multiply charged ions and soft x-rays from the plasmas produced by laser pulses focused on (111) surface of Fe and Fe-2 mass % Si single crystals is investigated for wavelengths of 1064 and 248 nm and intensities up to approximate to 1x10(10) W/cm(2). It is demonstrated that the Si admixture in the Fe plasma results in a higher emission of Feq+ ions (1 <= q <= 4) but in a markedly lower x-ray emission. The relation of wavelengths and pulse durations of laser beams used is figured in the fluence dependence of the ion emission.

Effects of 2 mass % Si admixture in a laser-produced Fe plasma

LORUSSO, ANTONELLA;NASSISI, Vincenzo;
2008-01-01

Abstract

Emission of multiply charged ions and soft x-rays from the plasmas produced by laser pulses focused on (111) surface of Fe and Fe-2 mass % Si single crystals is investigated for wavelengths of 1064 and 248 nm and intensities up to approximate to 1x10(10) W/cm(2). It is demonstrated that the Si admixture in the Fe plasma results in a higher emission of Feq+ ions (1 <= q <= 4) but in a markedly lower x-ray emission. The relation of wavelengths and pulse durations of laser beams used is figured in the fluence dependence of the ion emission.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11587/332080
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