We consider a trapping - detrapping noise model to explain the recently observed maximum in the spectral density of current fluctuations in organic semiconductors (tetracene, pentacene), under space-charge-limited-current conditions. The ratio u=nt/Nt of filled to total traps is obtained from the current-voltage characteristics and is used to evaluate the current noise spectral density at the trap-filling transition.
Noise maximum at trap-filling transition in polyacenes
PENNETTA, Cecilia;REGGIANI, Lino
2009-01-01
Abstract
We consider a trapping - detrapping noise model to explain the recently observed maximum in the spectral density of current fluctuations in organic semiconductors (tetracene, pentacene), under space-charge-limited-current conditions. The ratio u=nt/Nt of filled to total traps is obtained from the current-voltage characteristics and is used to evaluate the current noise spectral density at the trap-filling transition.File in questo prodotto:
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