We consider a trapping - detrapping noise model to explain the recently observed maximum in the spectral density of current fluctuations in organic semiconductors (tetracene, pentacene), under space-charge-limited-current conditions. The ratio u=nt/Nt of filled to total traps is obtained from the current-voltage characteristics and is used to evaluate the current noise spectral density at the trap-filling transition.
Noise maximum at trap-filling transition in polyacenes
PENNETTA, Cecilia;REGGIANI, Lino
2009-01-01
Abstract
We consider a trapping - detrapping noise model to explain the recently observed maximum in the spectral density of current fluctuations in organic semiconductors (tetracene, pentacene), under space-charge-limited-current conditions. The ratio u=nt/Nt of filled to total traps is obtained from the current-voltage characteristics and is used to evaluate the current noise spectral density at the trap-filling transition.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.