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EnglishWe performed thermo and piezoresistive measurements on GaN bulk samples grown with different techniques (PIMBE, MOCVD). By analysing the I(V) characteristics as a function of temperature, we found a temperature coefficient of resistance (TCR ¼ a) of the same order of magnitude (a few percent per C) as commercial thermistors, with a peak value of 19%/C. The measured gauge factor is about five, a value comparable with that obtained for GaN by other groups. We also performed PC vs. temperature measurements on a MQW GaN/AlGaN finding a peak shift of about 0.4 meV/K.
| Titolo: | Thermoresistive and piezoresistive properties of wurtzite n-GaN |
| Autori: | |
| Data di pubblicazione: | 2002 |
| Rivista: | |
| Abstract: | We performed thermo and piezoresistive measurements on GaN bulk samples grown with different techniques (PIMBE, MOCVD). By analysing the I(V) characteristics as a function of temperature, we found a temperature coefficient of resistance (TCR ¼ a) of the same order of magnitude (a few percent per C) as commercial thermistors, with a peak value of 19%/C. The measured gauge factor is about five, a value comparable with that obtained for GaN by other groups. We also performed PC vs. temperature measurements on a MQW GaN/AlGaN finding a peak shift of about 0.4 meV/K. |
| Handle: | http://hdl.handle.net/11587/107349 |
| Appare nelle tipologie: | Articolo pubblicato su Rivista |
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