In a context where the complexity of systems and their interconnection is increasing exponentially, the possibility of being able to monitor the structural integrity of crucial parts of structures is of considerable importance. In addition, the availability of modern and advanced tools opens the door to the advent of new diagnostic techniques. In this regard, the authors here deeply investigate and test a modern technique that allows to analyze a structure starting from a photo in order to identify and locate damage present in the structure in a rapid and non-destructive way. This allows to obtain an accurate location of the damage and consequently a quick evaluation of its state of integrity. Moreover, a further advantage lies in the possibility of carrying out the nalysis in a non-invasive way without any physical interaction with the analyzed structure. The suitability of the technique is tested on a statically deformed beam in epoxy glass laminate. It has a notch, which represents the defect, and the goal is to determine the notch position, which is not visible in the photo. The basis of the proposed method is the correlation between the curvature that the beam presents under load conditions and its flexural stiffness. The damage on the beam, infact, leads to a punctual alteration of its flexibility which is identified by sudden changes in the second derivative of the transversal deflection. The proposed methodology consists in taking a photo of the inflected beam; subsequently, the acquired photo is manipulated with specifically designed image processing tools, first to segment the beam shape and then to extract its axis. Finally, the second derivative is extracted using two different numerical differentiator filters (Lanczos filters and Gaussian wavelets) along with suitable processing to reduce the border distortions. The tests conducted demonstrate that it is possible to accurately detect the position of the notch. Although the authors realize that the technique can generally need sensibly large displacements, the results seem promising. Such a need is probably due to the resolution of the camera, which can sometimes represent a technological limit. It is believed that higher resolution would allow damage to be detected even for smaller displacements. A fundamental advantage is the speed of the methodology illustrated since it takes just a few moments from taking the photo to evaluating the results. This is accompanied by the ease of acquiring the measurement, which involves the use of the camera and its support without additional equipment.
Crack localization on a statically deflected beam by high-resolution photos
De Nunzio A. V.
;Faraco G.
;Giannoccaro N. I.;Messina A.
2023-01-01
Abstract
In a context where the complexity of systems and their interconnection is increasing exponentially, the possibility of being able to monitor the structural integrity of crucial parts of structures is of considerable importance. In addition, the availability of modern and advanced tools opens the door to the advent of new diagnostic techniques. In this regard, the authors here deeply investigate and test a modern technique that allows to analyze a structure starting from a photo in order to identify and locate damage present in the structure in a rapid and non-destructive way. This allows to obtain an accurate location of the damage and consequently a quick evaluation of its state of integrity. Moreover, a further advantage lies in the possibility of carrying out the nalysis in a non-invasive way without any physical interaction with the analyzed structure. The suitability of the technique is tested on a statically deformed beam in epoxy glass laminate. It has a notch, which represents the defect, and the goal is to determine the notch position, which is not visible in the photo. The basis of the proposed method is the correlation between the curvature that the beam presents under load conditions and its flexural stiffness. The damage on the beam, infact, leads to a punctual alteration of its flexibility which is identified by sudden changes in the second derivative of the transversal deflection. The proposed methodology consists in taking a photo of the inflected beam; subsequently, the acquired photo is manipulated with specifically designed image processing tools, first to segment the beam shape and then to extract its axis. Finally, the second derivative is extracted using two different numerical differentiator filters (Lanczos filters and Gaussian wavelets) along with suitable processing to reduce the border distortions. The tests conducted demonstrate that it is possible to accurately detect the position of the notch. Although the authors realize that the technique can generally need sensibly large displacements, the results seem promising. Such a need is probably due to the resolution of the camera, which can sometimes represent a technological limit. It is believed that higher resolution would allow damage to be detected even for smaller displacements. A fundamental advantage is the speed of the methodology illustrated since it takes just a few moments from taking the photo to evaluating the results. This is accompanied by the ease of acquiring the measurement, which involves the use of the camera and its support without additional equipment.File | Dimensione | Formato | |
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