A systematic XPS investigation was performed on a series of RuOx/Teflon samples with various loadings. The in-depth distribution of the supported catalyst was also investigated by XPS anal. at variable take-off angle coupled with static and dynamic SIMS measurements. A preferential location of Ru in the region just underneath the Teflon surface was clearly evident.
XPS and SIMS investigation on the catalyst-support chemical interaction for ruthenium oxide (RuOx)-Teflon systems
MALITESTA, Cosimino;
1989-01-01
Abstract
A systematic XPS investigation was performed on a series of RuOx/Teflon samples with various loadings. The in-depth distribution of the supported catalyst was also investigated by XPS anal. at variable take-off angle coupled with static and dynamic SIMS measurements. A preferential location of Ru in the region just underneath the Teflon surface was clearly evident.File in questo prodotto:
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