We investigate the steady state of a two-dimensional random resistor network subjected to two competing biased stochastic processes. The properties of the linear and nonlinear regimes are studied by means of Monte Carlo simulations. In constant current conditions, a scaling relation is found between ...

Linear and nonlinear regime of a random resistor network under biased percolation

PENNETTA, Cecilia;ALFINITO, ELEONORA;REGGIANI, Lino
2004-01-01

Abstract

We investigate the steady state of a two-dimensional random resistor network subjected to two competing biased stochastic processes. The properties of the linear and nonlinear regimes are studied by means of Monte Carlo simulations. In constant current conditions, a scaling relation is found between ...
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11587/103653
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