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Titolo Data di pubblicazione Autore(i) File
Migration Energy of Interstitial Ions in Si end Ge 1-gen-1982 Pennetta, Cecilia; A., Baldereschi
Photoconductivity and Trapping Parameters in Hydrogenated Amorphous Silicon Films 1-gen-1983 S., Galassini; Micocci, Gioacchino; Pennetta, Cecilia; A., Rizzo; Tepore, Antonio; F., Zuanni
A Total-Energy Study of Proton Diffusion in Crystalline Silicon 1-gen-1989 Pennetta, Cecilia
Study of a Positive Hydrogen Ion in Crystalline Si 1-gen-1989 Pennetta, Cecilia; A., Baldereschi
Positron Energy Bands and Wave Functions in a Si Crystal 1-gen-1989 Pennetta, Cecilia; A., Baldereschi
Quantum Behaviour of Muons in Crystalline Si 1-gen-1990 Pennetta, Cecilia; A., Baldereschi
Mass Dependence of the Ground State of Charged Particles in a Silicon Crystal 1-gen-1991 Pennetta, Cecilia; A., Baldereschi
Behaviour of a Positive Hydrogen Ion in Crystalline Si 1-gen-1991 Pennetta, Cecilia
Work Function and Energy Levels of Positrons in Crystalline Si 1-gen-1991 Pennetta, Cecilia
Work function and energy levels of positrons in crystalline silicon 1-gen-1991 Pennetta, C.
Biased Percolation and Abrupt Failure of Electronic Devices 1-gen-1996 Z., Gingl; Pennetta, Cecilia; L. B., Kiss; L., Reggiani
An Extended Analysis of Noise and Resistance Degradation within the Biased Percolation Model 1-gen-1996 Z., Gingl; Pennetta, Cecilia; L. B., Kiss; Reggiani, Lino
Advances in Noise Modelling of High-Field Transport in Semiconductor Materials and Structures 1-gen-1996 Reggiani, Lino; P., Golinelli; A., Greiner; Pennetta, Cecilia; V., Gruzinskis; E., Starikov; P., Shiktorov; L., Varani; J. C., Vaissiere; J. P., Nougier; D., Pardo; T., Gonzalez; M. J., Martin; J. E., Velazquez
Mechanisms of Breakdown in Semi-Insulating GaAs Detectors Under High Reverse Bias Conditions Studied by EBIC and OBIC 1-gen-1997 Mazzer, M.; Cola, A.; Vasanelli, Lorenzo; DE VITTORIO, M.; Pennetta, Cecilia; Reggiani, Lino
Biased Percolation and Electrical Breakdown 1-gen-1997 Pennetta, Cecilia; Z., Gingl; L. B., Kiss; L., Reggiani
Microscopic Description of Diffusion Noise Sources 1-gen-1997 P., Shiktorov; E., Starikov; V., Gruzinskis; Reggiani, Lino; Pennetta, Cecilia; T., Gonzalez; J., Mateos; D., Pardo; L., Varani
Biased Percolation and Noise Analysis of Electrical Breakdown 1-gen-1997 Z., Gingl; Pennetta, Cecilia; L. B., Kiss; Reggiani, Lino
Biased Percolation Model for the Analysis of Electronic Device Degradation 1-gen-1997 Z., Gingl; Pennetta, Cecilia; L. B., Kiss; Reggiani, Lino
Microscopic Interpretation of the Noise-Temperature Spectrum in Two-Terminal Devices 1-gen-1997 Reggiani, Lino; Pennetta, Cecilia; V., Gruzinskis; P., Shiktorov; E., Starikov; L., Varani
A Numerical Simulation of Excess Noise for Degradation and Failure of Thin Film Resistors 1-gen-1997 Pennetta, Cecilia; Z., Gingl; L. B., Kiss; Reggiani, Lino
Mostrati risultati da 1 a 20 di 136
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