Sfoglia per Autore FARELLA, ISABELLA
NUMERICAL SIMULATION OF CSP BASED ON NANORECTENNA TECHNOLOGY
2012-01-01 DE RISI, Arturo; Milanese, Marco; Mauro, Lomascolo; Taurino, Antonietta; Farella, Isabella
Structural, morphological and chemical properties of Cu/TiN versus Cu thin layers for HEMT backside metallization
2014-01-01 Taurino, Antonietta; Signore, MARIA ASSUNTA; M., Catalano; Farella, Isabella; F., Quaranta; DI GIULIO, Massimo; Vasanelli, Lorenzo; Siciliano, Pietro
Subgap Time of Flight as a defect spectroscopy: application to CdTe:Cl radiation detectors
2016-01-01 Pousset, Jeremy; Farella, Isabella; Cola, A.; Gambino, Salvatore
Subgap time of flight: A spectroscopic study of deep levels in semi-insulating CdTe:Cl
2016-01-01 Pousset, Jeremy; Farella, Isabella; Gambino, Salvatore; Cola, A.
Pulse-Atomic Force Lithography: A Powerful Nanofabrication Technique to Fabricate Constant and Varying-Depth Nanostructures
2022-01-01 Pellegrino, Paolo; Bramanti, ALESSANDRO PAOLO; Farella, Isabella; Cascione, Mariafrancesca; DE MATTEIS, Valeria; Della Torre, Antonio; Quaranta, Fabio; Rinaldi, Rosaria
Investigation of the Effects of Pulse-Atomic Force Nanolithography Parameters on 2.5D Nanostructures’ Morphology
2022-01-01 Pellegrino, Paolo; Farella, Isabella; Cascione, Mariafrancesca; DE MATTEIS, Valeria; Bramanti, ALESSANDRO PAOLO; Della Torre, Antonio; Quaranta, Fabio; Rinaldi, Rosaria
Pile-Ups Formation in AFM-Based Nanolithography: Morpho-Mechanical Characterization and Removal Strategies
2022-01-01 Pellegrino, Paolo; Farella, Isabella; Cascione, Mariafrancesca; DE MATTEIS, Valeria; Bramanti, ALESSANDRO PAOLO; Vincenti, Lorenzo; Della Torre, Antonio; Quaranta, Fabio; Rinaldi, Rosaria
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| NUMERICAL SIMULATION OF CSP BASED ON NANORECTENNA TECHNOLOGY | 1-gen-2012 | DE RISI, Arturo; Milanese, Marco; Mauro, Lomascolo; Taurino, Antonietta; Farella, Isabella | |
| Structural, morphological and chemical properties of Cu/TiN versus Cu thin layers for HEMT backside metallization | 1-gen-2014 | Taurino, Antonietta; Signore, MARIA ASSUNTA; M., Catalano; Farella, Isabella; F., Quaranta; DI GIULIO, Massimo; Vasanelli, Lorenzo; Siciliano, Pietro | |
| Subgap Time of Flight as a defect spectroscopy: application to CdTe:Cl radiation detectors | 1-gen-2016 | Pousset, Jeremy; Farella, Isabella; Cola, A.; Gambino, Salvatore | |
| Subgap time of flight: A spectroscopic study of deep levels in semi-insulating CdTe:Cl | 1-gen-2016 | Pousset, Jeremy; Farella, Isabella; Gambino, Salvatore; Cola, A. | |
| Pulse-Atomic Force Lithography: A Powerful Nanofabrication Technique to Fabricate Constant and Varying-Depth Nanostructures | 1-gen-2022 | Pellegrino, Paolo; Bramanti, ALESSANDRO PAOLO; Farella, Isabella; Cascione, Mariafrancesca; DE MATTEIS, Valeria; Della Torre, Antonio; Quaranta, Fabio; Rinaldi, Rosaria | |
| Investigation of the Effects of Pulse-Atomic Force Nanolithography Parameters on 2.5D Nanostructures’ Morphology | 1-gen-2022 | Pellegrino, Paolo; Farella, Isabella; Cascione, Mariafrancesca; DE MATTEIS, Valeria; Bramanti, ALESSANDRO PAOLO; Della Torre, Antonio; Quaranta, Fabio; Rinaldi, Rosaria | |
| Pile-Ups Formation in AFM-Based Nanolithography: Morpho-Mechanical Characterization and Removal Strategies | 1-gen-2022 | Pellegrino, Paolo; Farella, Isabella; Cascione, Mariafrancesca; DE MATTEIS, Valeria; Bramanti, ALESSANDRO PAOLO; Vincenti, Lorenzo; Della Torre, Antonio; Quaranta, Fabio; Rinaldi, Rosaria |
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